Digital systems testing and testable design / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman
データ種別 |
図書 |
出版者 |
Piscataway, NJ : IEEE Press |
出版者 |
New York : Institute of Electrical and Electronics Engineers |
出版年 |
c1990 |
本文言語 |
英語 |
大きさ |
xvii, 652 p. : ill. ; 26 cm |
所蔵情報を非表示
1
秋田公立美術大学
配架場所 |
巻 次 |
請求記号 |
登録番号 |
状 態 |
ISBN |
刷 年 |
利用注記 |
予約 |
指定図書 |
閉架書庫
|
|
549.3 || A14
|
0113850
|
|
0780310624
|
1990
|
|
|
|
書誌詳細を非表示
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