Digital systems testing and testable design / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman
| データ種別 | 図書 |
|---|---|
| 出版者 | Piscataway, NJ : IEEE Press |
| 出版者 | New York : Institute of Electrical and Electronics Engineers |
| 出版年 | c1990 |
| 本文言語 | 英語 |
| 大きさ | xvii, 652 p. : ill. ; 26 cm |
所蔵情報を非表示
1
秋田公立美術大学
| 配架場所 | 巻 次 | 請求記号 | 登録番号 | 状 態 | コメント | ISBN | 刷 年 | 利用注記 | 予約 | 指定図書 |
|---|---|---|---|---|---|---|---|---|---|---|
| 閉架書庫 |
|
549.3 || A14 | 0113850 |
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0780310624 | 1990 |
|
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書誌詳細を非表示
| 一般注記 | Includes bibliographical references (p. 644-645) and index IEEE order no. PC04168 Rev. print. publisher: IEEE and Wiley-Interscience |
|---|---|
| 著者標目 | *Abramovici, Miron Breuer, Melvin A. Friedman, Arthur D. |
| 件 名 | LCSH:Digital integrated circuits -- Testing LCSH:Digital integrated circuits -- Design and construction |
| 分 類 | LCC:TK7874 DC20:621.381/5 |
| 書誌ID | 2000038348 |
| ISBN | 0780310624 |
| NCID | BA27278679 |
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